Diagnose potential faults in industrial, electrical, and mechanical systems, or discover temperature anomalies in R&D testing with the 464 × 348 resolution FLIR T540. This portable, ergonomic thermal camera offers advanced features like 1-Touch Level/Span and continuous laser-assisted autofocus, making it the perfect non-contact diagnostic tool for condition monitoring and research applications. Streamline electrical/mechanical surveys, troubleshooting, and repairs with Inspection Route mode, which runs pre-planned routes created in FLIR Thermal Studio Pro (Route Creator plugin required) so users can record temperature data and imagery in a logical sequence. The built-in Macro Mode allows R&D users to quickly switch from wide angle to close-up analysis without changing the lens. When coupled with Research Studio software, the T540 helps engineers assess unexpected hot spots and find potential design flaws.
Key Features:
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MAKE CRITICAL DECISIONS QUICKLY Laser-assisted autofocus guarantees you’ll get tack-sharp focus for accurate temperature readings that lead to quick but solid decisions.
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FLEXIBLE AND ERGONOMIC The T540’s optical block rotates 180°, so you can image targets at any angle—comfortably—all day long.
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INTUITIVE USER INTERFACE The capacitive touchscreen with intuitive menu is easy to navigate, plus you can customize with two programmable buttons.
Description
Technical Specifications:
Imaging and optical data | |
Infrared resolution | 464 × 348 pixels |
UltraMax (super-resolution)1 | Yes |
NETD | <50 mK @ 30°C (86°F) |
Field of view | 14° × 10° |
Minimum focus distance | 1.0 m (3.28 ft) |
Minimum focus distance with MSX | 1.0 m (3.28 ft) |
Focal length | 29 mm (1.41 in) |
Spatial resolution (IFOV) | 0.52 mrad/pixel |
Available extra lenses | 42° (AutoCal) 24° (AutoCal) 6° (service calibration required) |
Lens identification | Automatic |
f number | 1.5 |
Image frequency | 30 Hz |
Focus | Continuous LDM One-shot LDM One-shot contrast Manual |
Field of view match | Yes |
Digital zoom | 1–6× continuous |
Detector data | |
Focal plane array/spectral range | Uncooled microbolometer/7.5–14 µm |
Detector pitch | 17 µm |
Image presentation | |
Resolution | 640 × 480 pixels (VGA) |
Surface brightness (cd/m2) | 400 |
Screen size | 4 in |
Viewing angle | 80° |
Color depth (bits) | 24 |
Aspect ratio | 04:03:00 |
Auto-rotation | Yes |
Touchscreen | Optically bonded PCAP |
Display technology | IPS |
Cover glass material | Dragontrail® |
Programmable buttons | 2 |
Viewfinder | No |
Image adjustment | Automatic Automatic maximum Automatic minimum Manual |
Image presentation modes | |
Infrared image | Yes |
Visual image | Yes |
MSX | Yes |
Picture in picture | Resizable and movable |
Gallery | Yes |
Measurement | |
Camera temperature range | –20 to 120°C (–4 to 248°F) 0 to 650°C (32 to 1202°F) 300 to 1500°C (572 to 2732°F) |
Object temperature range and accuracy (for ambient temp. 15 to 35°C (59 to 95°F) | Range –20 to 120°C (–4 to 248°F): –20 to 100°C (–4 to 212°F): ±2°C (±3.6°F) 100 to 120°C (212 to 248°F): ±2% Range 0 to 650°C (32 to 1202°F): 0 to 100°C (32 to 212°F): ±2°C (±3.6°F) 100 to 650°C (212 to 1202°F): ±2% Range 300 to 1500°C (572 to 2732°F): ±2% |
Screening mode | |
Sampling average mode | Recommended temperature range: 30 to 45°C (86 to 113°F) in stable room temperatureAccuracy (drift): ±0.3°C (±0.5°F)2 |
Inspection mode | |
FLIR Inspection route | Enabled in the camera |
Measurement analysis | |
Spotmeter | 3 in live mode |
Area | 3 in live mode |
Automatic hot/cold detection | Automatic maximum/minimum markers within area |
Measurement presets | No measurements Center spot Hot spot Cold spot User preset 1 User preset 2 |
Difference temperature | Yes |
Reference temperature | Yes |
Emissivity correction | Yes, variable from 0.01 to 1.0 or selected from materials list |
Measurement corrections | Yes |
External optics/windows correction | Yes |
Alarm | |
Color alarm (isotherm) | Above Below Interval Condensation (moisture/humidity/dewpoint) Insulation |
Measurement function alarm | Audible/visual alarms (above/below) on any selected measurement function |